Electromigration in ULSI Interconnections /

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Bibliographic Details
Main Author: Tan, Cher Ming, 1959-
Format: Book
Language:English
Published: Singapore ; Hackensack, NJ : World Scientific, c2010.
Series:International series on advances in solid state electronics and technology
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Cây tri thức 2

Holdings details from Cây tri thức 2
Call Number: 621.381 E201E 2010
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