APA Citation

Tan, C. M. (2010). Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific.

Chicago Style Citation

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.

MLA Citation

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.

Warning: These citations may not always be 100% accurate.