Electromigration in ULSI Interconnections /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Singapore ; Hackensack, NJ :
World Scientific,
c2010.
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| Series: | International series on advances in solid state electronics and technology
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| Subjects: | |
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Tầng 4 - A10 - Khu đọc mở
| Call Number: |
621.381 E201E 2010 |
|---|---|
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