Electromigration in ULSI Interconnections /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Singapore ; Hackensack, NJ :
World Scientific,
c2010.
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| Series: | International series on advances in solid state electronics and technology
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| Subjects: | |
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| Physical Description: | xix, 291 p. : ill. ; 24 cm. |
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| ISBN: | 9789814273329 9814273325 |