Surface and thin film analysis : a compendium of principles, instrumentation, and applications /

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron,...

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Tác giả chính: Friedbacher, Gernot
Đồng tác giả: Friedbacher, Gernot., Bubert, H.
Định dạng: Sách tham khảo chuyên ngành
Ngôn ngữ:English
Nhà xuất bản: Weinheim : Wiley-VCH, c2011.
Phiên bản:2nd, completely rev. and enlarged ed.
Chủ đề:
Truy cập trực tuyến:https://dlib.phenikaa-uni.edu.vn/handle/PNK/1862
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520 3 |a Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. 
650 0 |a Thin films  |x Surfaces  |x Analysis. 
650 0 |a Electron spectroscopy. 
650 0 |a Spectrum analysis. 
700 1 |a Friedbacher, Gernot. 
700 1 |a Bubert, H.  |q (Henning) 
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