Surface and thin film analysis : a compendium of principles, instrumentation, and applications /
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron,...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Specialized reference book |
| Language: | English |
| Published: |
Weinheim :
Wiley-VCH,
c2011.
|
| Edition: | 2nd, completely rev. and enlarged ed. |
| Subjects: | |
| Online Access: | https://dlib.phenikaa-uni.edu.vn/handle/PNK/1862 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. |
|---|---|
| Physical Description: | xxiv, 533 p. : ill. (some col.) ; 25 cm. |
| ISBN: | 9783527320479 |