Surface and thin film analysis : a compendium of principles, instrumentation, and applications /
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron,...
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| Tác giả chính: | |
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| Đồng tác giả: | , |
| Định dạng: | Sách tham khảo chuyên ngành |
| Ngôn ngữ: | English |
| Nhà xuất bản: |
Weinheim :
Wiley-VCH,
c2011.
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| Phiên bản: | 2nd, completely rev. and enlarged ed. |
| Chủ đề: | |
| Truy cập trực tuyến: | https://dlib.phenikaa-uni.edu.vn/handle/PNK/1862 |
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| Tóm tắt: | Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. |
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| Mô tả vật lý: | xxiv, 533 p. : ill. (some col.) ; 25 cm. |
| Số ISBN: | 9783527320479 |