Surface and thin film analysis : a compendium of principles, instrumentation, and applications /

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron,...

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Bibliographic Details
Main Author: Friedbacher, Gernot
Other Authors: Friedbacher, Gernot., Bubert, H.
Format: Specialized reference book
Language:English
Published: Weinheim : Wiley-VCH, c2011.
Edition:2nd, completely rev. and enlarged ed.
Subjects:
Online Access:https://dlib.phenikaa-uni.edu.vn/handle/PNK/1862
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245 0 0 |a Surface and thin film analysis :  |b a compendium of principles, instrumentation, and applications /  |c edited by Gernot Friedbacher and Henning Bubert. 
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300 |a xxiv, 533 p. :  |b ill. (some col.) ;  |c 25 cm. 
520 3 |a Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. 
650 0 |a Thin films  |x Surfaces  |x Analysis. 
650 0 |a Electron spectroscopy. 
650 0 |a Spectrum analysis. 
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700 1 |a Bubert, H.  |q (Henning) 
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