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Multilevel interconnect reliability on the effects of electro - thermomechanical stresses : Dessertation /

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Bibliographic Details
Main Author: Nguyen, Van Hieu
Format: Book
Language:English
Published: Netgerlands : [s.n.], 2004.
Subjects:
Cơ điện
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Description
Physical Description:135 tr. ; 24 cm.
ISBN:9036520290

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