Optical characterizations of lightly doped (PbS)1−x Znx thin films influenced by film thickness and annealing temperature for applications in highly intensive radiation systems

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Bibliographic Details
Main Authors: Shokr, E. Kh., Mohamed, W. S., Adam, A. G.
Format: Book
Language:English
Published: Springer 2023
Subjects:
XRD
Online Access:https://link.springer.com/article/10.1007/s10854-023-11274-0
https://dlib.phenikaa-uni.edu.vn/handle/PNK/9478
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