Shokr, E. K. (2023). Optical characterizations of lightly doped (PbS)1−x Znx thin films influenced by film thickness and annealing temperature for applications in highly intensive radiation systems. Springer.
Chicago Style CitationShokr, E. Kh. Optical Characterizations of Lightly Doped (PbS)1−x Znx Thin Films Influenced By Film Thickness and Annealing Temperature for Applications in Highly Intensive Radiation Systems. Springer, 2023.
MLA CitationShokr, E. Kh. Optical Characterizations of Lightly Doped (PbS)1−x Znx Thin Films Influenced By Film Thickness and Annealing Temperature for Applications in Highly Intensive Radiation Systems. Springer, 2023.
Warning: These citations may not always be 100% accurate.