Nguyen, V. H. (2004). Multilevel interconnect reliability on the effects of electro - thermomechanical stresses: Dessertation. Netgerlands: [s.n.].
Trích dẫn theo kiểu ChicagoNguyen, Van Hieu. Multilevel Interconnect Reliability On the Effects of Electro - Thermomechanical Stresses: Dessertation. Netgerlands: [s.n.], 2004.
Trích dẫn MLANguyen, Van Hieu. Multilevel Interconnect Reliability On the Effects of Electro - Thermomechanical Stresses: Dessertation. Netgerlands: [s.n.], 2004.
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