Nguyen, V. H. (2004). Multilevel interconnect reliability on the effects of electro - thermomechanical stresses: Dessertation. Netgerlands: [s.n.].
Chicago Style CitationNguyen, Van Hieu. Multilevel Interconnect Reliability On the Effects of Electro - Thermomechanical Stresses: Dessertation. Netgerlands: [s.n.], 2004.
MLA CitationNguyen, Van Hieu. Multilevel Interconnect Reliability On the Effects of Electro - Thermomechanical Stresses: Dessertation. Netgerlands: [s.n.], 2004.
Warning: These citations may not always be 100% accurate.