DLTS Study of Defects in HgCdTe Heterostructure Photodiode

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Main Authors: Majkowycz, K., Murawski, K., Manyk, T.
Format: Book
Language:Spanish / Castilian
Published: Springer 2023
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Online Access:https://link.springer.com/article/10.1007/s11664-023-10653-x
https://dlib.phenikaa-uni.edu.vn/handle/PNK/9516
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spelling oai:localhost:PNK-95162023-10-10T08:15:40Z DLTS Study of Defects in HgCdTe Heterostructure Photodiode Majkowycz, K. Murawski, K. Manyk, T. MOCVD DLTS CC-BY Deep-level transient spectroscopy (DLTS) measurements were performed on HgCdTe heterostructure photodiode grown by metal-organic chemical vapor deposition (MOCVD) on GaAs substrate. In order to extract defects from individual layers of the heterostructure, three consecutive etchings were performed. In the first experiment, the N+/T/p/T/P+/n+ structure was chemically etched to the N+ bottom contact to obtain a mesa-type detector. Six localized defects were extracted across the entire photodiode. In the second experiment, the bottom contact was made to the p-type absorber. Two localized defects were found in the p/T/P+/n+ structure. 2023-10-10T08:15:40Z 2023-10-10T08:15:40Z 2023 Book https://link.springer.com/article/10.1007/s11664-023-10653-x https://dlib.phenikaa-uni.edu.vn/handle/PNK/9516 es application/pdf Springer
institution Digital Phenikaa
collection Digital Phenikaa
language Spanish / Castilian
topic MOCVD
DLTS
spellingShingle MOCVD
DLTS
Majkowycz, K.
Murawski, K.
Manyk, T.
DLTS Study of Defects in HgCdTe Heterostructure Photodiode
description CC-BY
format Book
author Majkowycz, K.
Murawski, K.
Manyk, T.
author_facet Majkowycz, K.
Murawski, K.
Manyk, T.
author_sort Majkowycz, K.
title DLTS Study of Defects in HgCdTe Heterostructure Photodiode
title_short DLTS Study of Defects in HgCdTe Heterostructure Photodiode
title_full DLTS Study of Defects in HgCdTe Heterostructure Photodiode
title_fullStr DLTS Study of Defects in HgCdTe Heterostructure Photodiode
title_full_unstemmed DLTS Study of Defects in HgCdTe Heterostructure Photodiode
title_sort dlts study of defects in hgcdte heterostructure photodiode
publisher Springer
publishDate 2023
url https://link.springer.com/article/10.1007/s11664-023-10653-x
https://dlib.phenikaa-uni.edu.vn/handle/PNK/9516
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