Huy, V. L. (2021). One More Evidence Supporting Damage Growth Inside Silicon MEMS Structures from Comparison of Strength Affected by Cyclic Compressive Stress. Lecture Notes in Mechanical Engineering.
Chicago Style CitationHuy, Vu Le. One More Evidence Supporting Damage Growth Inside Silicon MEMS Structures From Comparison of Strength Affected By Cyclic Compressive Stress. Lecture Notes in Mechanical Engineering, 2021.
MLA CitationHuy, Vu Le. One More Evidence Supporting Damage Growth Inside Silicon MEMS Structures From Comparison of Strength Affected By Cyclic Compressive Stress. Lecture Notes in Mechanical Engineering, 2021.
Warning: These citations may not always be 100% accurate.