Huy, V. L. (2021). One More Evidence Supporting Damage Growth Inside Silicon MEMS Structures from Comparison of Strength Affected by Cyclic Compressive Stress. Lecture Notes in Mechanical Engineering.
Trích dẫn theo kiểu ChicagoHuy, Vu Le. One More Evidence Supporting Damage Growth Inside Silicon MEMS Structures From Comparison of Strength Affected By Cyclic Compressive Stress. Lecture Notes in Mechanical Engineering, 2021.
Trích dẫn MLAHuy, Vu Le. One More Evidence Supporting Damage Growth Inside Silicon MEMS Structures From Comparison of Strength Affected By Cyclic Compressive Stress. Lecture Notes in Mechanical Engineering, 2021.
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