Microstructural characterization of materials /

Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials...

Full description

Saved in:
Bibliographic Details
Main Author: Brandon, D. G.
Other Authors: Kaplan, Wayne D.
Format: Specialized reference book
Language:English
Published: Chichester, England : John Wiley & Sons, c2008.
Edition:2nd ed.
Series:Quantitative software engineering series
Subjects:
Online Access:https://dlib.phenikaa-uni.edu.vn/handle/PNK/1816
Tags: Add Tag
No Tags, Be the first to tag this record!
LEADER 02186cam a22002897a 4500
005 20210616145241.0
008 210420t2008 enk b 001 | eng
999 |c 6589  |d 6589 
020 |a 9780470027851  |c 1915000đ 
040 |a Phenikaa Uni  |c Phenikaa Uni  |b eng  |e aacr2 
041 |a eng 
044 |a enk 
082 0 0 |a 620.1  |2 23  |b M301R 2008 
100 1 |a Brandon, D. G. 
245 1 0 |a Microstructural characterization of materials /  |c David Brandon and Wayne Kaplan. 
250 |a 2nd ed. 
260 |a Chichester, England :  |b John Wiley & Sons,  |c c2008. 
300 |a xiv, 536 p. :  |b ill. (some col.) ;  |c 25 cm. 
490 0 |a Quantitative software engineering series 
520 3 |a Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ 
650 0 |a Materials  |x Microscopy. 
650 0 |a Microstructure. 
650 0 |a Kỹ thuật vật liệu 
700 1 |a Kaplan, Wayne D. 
856 |u https://dlib.phenikaa-uni.edu.vn/handle/PNK/1816 
942 |2 ddc  |c STKCN 
952 |0 0  |1 0  |2 ddc  |4 0  |6 620_100000000000000_M301R_2008  |7 1  |9 28866  |a PHENIKAA  |b PHENIKAA  |c PNK_105  |d 2021-04-20  |e Mua  |g 1915000.00  |l 0  |o 620.1 M301R 2008  |p 00027540  |r 2021-04-20  |v 1915000.00  |w 2021-04-20  |y STKCN